SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Porous silicon layers for optical recording
Sal'kova, E. N., Nelep, Constantin, Kaganovich, E. B., Savchuk, A. V., Sergan, T. A., Svechnikov, Sergey V., Valakh, Mikhail Y.Volume:
2648
Year:
1995
Language:
english
DOI:
10.1117/12.226234
File:
PDF, 224 KB
english, 1995