SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX - Efficiency loss of lumogen-coated CCDs by exposure to ultraviolet and extreme ultraviolet photons
Catura, Richard C., Duncan, Dexter W., Shing, Lawrence, Tarbell, Theodore D., Wolfson, C. Jacob, Siegmund, Oswald H. W., Gummin, Mark A.Volume:
3445
Year:
1998
Language:
english
DOI:
10.1117/12.330286
File:
PDF, 359 KB
english, 1998