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SPIE Proceedings [SPIE Electronic Imaging '99 - San Jose, CA (Saturday 23 January 1999)] Machine Vision Applications in Industrial Inspection VII - Image retrieval in the industrial environment
Tobin, Jr., Kenneth W., Karnowski, Thomas P., Ferrell, Regina K., Tobin, Jr., Kenneth W., Chang, Ning S.Volume:
3652
Year:
1999
Language:
english
DOI:
10.1117/12.341138
File:
PDF, 3.94 MB
english, 1999