SPIE Proceedings [SPIE Laser Metrology for Precision Management and Inspection in Industry - Florianopolis, Brazil (Thursday 22 February 2001)] Laser Metrology for Precision Measurement and Inspection in Industry - Comparison between laser interferometric and calibrated artifacts for the geometric test of machine tools
Sousa, Andre R., Schneider, Carlos A., Albertazzi, Jr., ArmandoVolume:
4420
Year:
2001
Language:
english
DOI:
10.1117/12.439217
File:
PDF, 796 KB
english, 2001