SPIE Proceedings [SPIE San Dieg - DL Tentative - San Diego, CA (Sunday 1 July 1990)] Optical Testing and Metrology III: Recent Advances in Industrial Optical Inspection - Focal length measurement using diffraction at a grating
Sirohi, Rajpal S., Kumar, Harish, Jain, Narinder K., Grover, Chander P.Volume:
1332
Year:
1991
Language:
english
DOI:
10.1117/12.51050
File:
PDF, 327 KB
english, 1991