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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Advanced Wavefront Control: Methods, Devices, and Applications - Testing highly aberrated large optics with a Shack-Hartmann wavefront sensor
Neal, Daniel R., Gonglewski, John D., Vorontsov, Mikhail A., Pulaski, Paul, Raymond, Thomas D., Gruneisen, Mark T., Neal, David A., Wang, Quandou, Griesmann, UlfVolume:
5162
Year:
2003
Language:
english
DOI:
10.1117/12.510795
File:
PDF, 521 KB
english, 2003