![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Cryogenic Optical Systems and Instruments X - Thermal design considerations for the cryogenic high-accuracy refraction measuring system (CHARMS)
Leviton, Douglas B., Heaney, James B., Frey, Bradley J., Burriesci, Lawrence G.Volume:
5172
Year:
2003
Language:
english
DOI:
10.1117/12.518683
File:
PDF, 1.19 MB
english, 2003