![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Chisinau - DL tentative - Chisinau, Moldova (Monday 3 May 2004)] Information Technologies 2004 - Precision measurement of impedance components by method of simulated resonance
Nastas, Vitalie, Andriesh, Andrei M., Perju, Veacheslav L.Volume:
5822
Year:
2004
Language:
english
DOI:
10.1117/12.612314
File:
PDF, 347 KB
english, 2004