SPIE Proceedings [SPIE Fifth Symposium - Santiago De Queretaro, Mexico (Thursday 8 September 2005)] Fifth Symposium Optics in Industry - Measurements of mechanical deformation using a full field optical interferometry and a fast camera
Pérez López, Carlos, Rosas, Eric, Cardoso, Rocío, Mendoza Santoyo, Fernando, Gutiérrez Zamarripa, Rodolfo, Bermudez, Juan C., Barbosa-García, Oracio, Caloca Mendez, CristianVolume:
6046
Year:
2005
Language:
english
DOI:
10.1117/12.674603
File:
PDF, 3.45 MB
english, 2005