SPIE Proceedings [SPIE 3rd International Symposium on Advanced Optical Manufacturing and testing technologies: Optical test and Measurement Technology and Equipment - Chengdu, China (Sunday 8 July 2007)] 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Effective indexes of refraction and limiting properties of ethyl red
Qi, Shengwen, Pan, Junhua, Wyant, James C., Liu, Yongliang, Liu, Anping, Wang, Hexin, Jing, Li, Li, Mingzhen, Wang, Jihua, Hao, Yongfa, Wang, BaoquanVolume:
6723
Year:
2007
Language:
english
DOI:
10.1117/12.783740
File:
PDF, 293 KB
english, 2007