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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, CA (Sunday 2 August 2009)] Optics for EUV, X-Ray, and Gamma-Ray Astronomy IV - SiC/Al multilayers for normal incidence EUV applications
Windt, David L., O'Dell, Stephen L., Pareschi, Giovanni, Bellotti, Jeffrey A.Volume:
7437
Year:
2009
Language:
english
DOI:
10.1117/12.824630
File:
PDF, 18.04 MB
english, 2009