SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Development of the tongue coating analyzer based on concave grating monochrometer and virtual instrument
Ren, Zhong, Jiang, Ya-Dong, Kippelen, Bernard, Liu, Guodong, Zeng, Lvming, Yu, Junsheng, Huang, Zhen, Zeng, WenpingVolume:
7658
Year:
2010
Language:
english
DOI:
10.1117/12.865532
File:
PDF, 308 KB
english, 2010