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SPIE Proceedings [SPIE 28th Annual Technical Symposium - San Diego (Tuesday 21 August 1984)] Infrared Technology X - New Development In Ndt Infrared Thermographic Techniques Help Assess Flaw Delaminations In Flight Hardware
Barney, J., Decker, H., Hodor, J., Mollicone, Richard A., Spiro, Irving J.Volume:
510
Year:
1985
Language:
english
DOI:
10.1117/12.945024
File:
PDF, 17.87 MB
english, 1985