![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Intl Conf on Fourier and Computerized Infrared Spectroscopy - Fairfax, VA (Monday 19 June 1989)] 7th Intl Conf on Fourier Transform Spectroscopy - Influences Of Surface Reflection On Diffuse Reflectance Measurements
Korte, E. H., Staat, H., Cameron, David G.Volume:
1145
Year:
1989
Language:
english
DOI:
10.1117/12.969606
File:
PDF, 32 KB
english, 1989