Wavefront measurement made by an off-the-shelf laser-scanning pico projector
Chen, Jia-Wei, Liang, Chao-Wen, Chen, Sheng-HuiVolume:
54
Language:
english
Journal:
Applied Optics
DOI:
10.1364/AO.54.00E235
Date:
October, 2015
File:
PDF, 993 KB
english, 2015