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[ECS 211th ECS Meeting - Chicago, Illinois (May 6-May 10, 2007)] ECS Transactions - Impact of Positive Charges on NBTI Degradation and Characterization in Ultra-Thin SiON Gate Dielectrics
Lei, Jin, Xu, MingzhenVolume:
6
Year:
2007
Language:
english
DOI:
10.1149/1.2728808
File:
PDF, 962 KB
english, 2007