Gate level leakage minimisation at 90 nm technology
Chakraborty, Angshuman, Pradhan, Sambhu NathVolume:
5
Year:
2013
Language:
english
Journal:
International Journal of Computer Aided Engineering and Technology
DOI:
10.1504/ijcaet.2013.056816
File:
PDF, 343 KB
english, 2013