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Excess silicon concentration dependence of the structural and optical properties of silicon nanocrystals embedded in silicon oxide matrix
Wahab, Yussof Bin, Woon, Yeong Wai, Deraman, Karim BinVolume:
5
Year:
2010
Language:
english
Journal:
International Journal of Nanomanufacturing
DOI:
10.1504/ijnm.2010.029925
File:
PDF, 369 KB
english, 2010