Process model-based analysis of highly crystalline and...

Process model-based analysis of highly crystalline and chemically pure molecular beam epitaxy of MgO (111) nano-thin films on 6H-SiC (0001) substrates

Uddin, Ghulam Moeen, Ziemer, Katherine S., Zeid, Abe, Kamarthi, Sagar
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Volume:
11
Year:
2015
Language:
english
Journal:
International Journal of Nanomanufacturing
DOI:
10.1504/ijnm.2015.070521
File:
PDF, 858 KB
english, 2015
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