A compact model for electrostatic discharge protection nanoelectronics simulation
Chou, Hung Mu, Yu, Shao Ming, Lee, Jam Wem, Li, YimingVolume:
2
Year:
2005
Language:
english
Journal:
International Journal of Nanotechnology
DOI:
10.1504/ijnt.2005.008061
File:
PDF, 404 KB
english, 2005