Capturing past experience: the Expert Scan visual mapping process
Ford, Simon J., Routley, Michèle J., Phaal, Robert, Probert, David R.Volume:
8
Year:
2012
Language:
english
Journal:
International Journal of Technology Intelligence and Planning
DOI:
10.1504/ijtip.2012.047377
File:
PDF, 1.83 MB
english, 2012