Capturing past experience: the Expert Scan visual mapping...

Capturing past experience: the Expert Scan visual mapping process

Ford, Simon J., Routley, Michèle J., Phaal, Robert, Probert, David R.
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Volume:
8
Year:
2012
Language:
english
Journal:
International Journal of Technology Intelligence and Planning
DOI:
10.1504/ijtip.2012.047377
File:
PDF, 1.83 MB
english, 2012
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