![](/img/cover-not-exists.png)
Electrochemically Scavenging the Silica Impurities at the Ni–YSZ Triple Phase Boundary of Solid Oxide Cells
Tao, Youkun, Shao, Jing, Cheng, ShiyangVolume:
8
Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.6b04723
Date:
July, 2016
File:
PDF, 1.24 MB
english, 2016