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Absolute interferometric characterization of an x-ray mirror surface profile
Vannoni, Maurizio, Martìn, Idoia FreijoVolume:
53
Language:
english
Journal:
Metrologia
DOI:
10.1088/0026-1394/53/1/1
Date:
February, 2016
File:
PDF, 673 KB
english, 2016