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Effects of defect pixel correction algorithms for x-ray detectors on image quality in planar projection and volumetric CT data sets
Kuttig, Jan, Steiding, Christian, Hupfer, Martin, Karolczak, Marek, Kolditz, DanielVolume:
26
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/26/9/095406
Date:
September, 2015
File:
PDF, 3.91 MB
english, 2015