Process Optimization and Device Characterization of Nonvolatile Charge Trap Memory Transistors Using In-Ga-ZnO Thin Films as Both Charge Trap and Active Channel Layers
Yun, Da-Jeong, Kang, Han-Byeol, Yoon, Sung-MinYear:
2016
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2016.2580220
File:
PDF, 1.06 MB
english, 2016