Semi-Empirical Method for Estimation of Single-Event Upset Cross Section for SRAM DICE Cells
Gorbunov, Maxim S., Boruzdina, Anna B., Dolotov, Pavel S.Year:
2016
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2016.2549749
File:
PDF, 1.21 MB
english, 2016