Proton-Induced Single-Event Degradation in SDRAMs

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IEEE Transactions on Nuclear Science 2016

Proton-Induced Single-Event Degradation in SDRAMs

Rodriguez, Axel, Wrobel, Frederic, Samaras, Anne, Bezerra, Francoise, Vandevelde, Benjamin, Ecoffet, Robert, Touboul, Antoine, Chatry, Nathalie, Dilillo, Luigi, Saigne, Frederic
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Year:
2016
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2016.2551733
File:
PDF, 915 KB
english, 2016
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