SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Recognition of poorly printed text by direct extraction of features from gray scale
Pavlidis, Theo, Wang, Li, Zhou, Jiangying, Sakoda, William J., Rocha, Jairo, D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.Volume:
1661
Year:
1992
Language:
english
DOI:
10.1117/12.130280
File:
PDF, 279 KB
english, 1992