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SPIE Proceedings [SPIE Photonics for Industrial Applications - Boston, MA (Monday 31 October 1994)] Intelligent Robots and Computer Vision XIII: 3D Vision, Product Inspection, and Active Vision - Analysis of errors in dimensional inspection based on active vision
Yang, Christopher C., Marefat, Michael M., Ciarallo, Frank W., Casasent, David P.Volume:
2354
Year:
1994
Language:
english
DOI:
10.1117/12.189077
File:
PDF, 773 KB
english, 1994