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SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 15 April 2013)] Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III - Active x-ray optics
Hudec, R., Inneman, A., Pina, L., Černá, Daniela, Tichý, Vladimir, Juha, Libor, Bajt, Saša, London, Richard, Hudec, René, Pina, LadislavVolume:
8777
Year:
2013
Language:
english
DOI:
10.1117/12.2021469
File:
PDF, 1.12 MB
english, 2013