SPIE Proceedings [SPIE Optical Sensing for Environmental and Process Monitoring - McLean, VA (Sunday 6 November 1994)] Optical Instrumentation for Gas Emissions Monitoring and Atmospheric Measurements - Comparison of NH3 point monitoring and diode-laser-based path-integrated measurements
Goldstein, Neil, Richtsmeier, Steven C., Lee, Jamine, Bien, Fritz, Fetzer, Gregory J., Groff, K. W., Leonelli, Joseph, Killinger, Dennis K., Vaughan, William, Yost, Michael G.Volume:
2366
Year:
1995
Language:
english
DOI:
10.1117/12.205589
File:
PDF, 853 KB
english, 1995