SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] Optical Manufacturing and Testing - Development of optical noncontact sensor for measurement of 3D profiles using the depolarized component of backscattered light
Mashimo, Kanji, Nakamura, Tetsuya, Tanimura, Yoshihisa, Doherty, Victor J., Stahl, H. PhilipVolume:
2536
Year:
1995
Language:
english
DOI:
10.1117/12.218422
File:
PDF, 525 KB
english, 1995