SPIE Proceedings [SPIE Photonics East '95 - Philadelphia,...

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SPIE Proceedings [SPIE Photonics East '95 - Philadelphia, PA (Sunday 22 October 1995)] Three-Dimensional and Unconventional Imaging for Industrial Inspection and Metrology - Online 3D sensor for accurate measurement of complex surface areas and volume

Benayad-Cherif, Faycal, Gordon, Steven J., Stoops, David, Descour, Michael R., Harding, Kevin G., Svetkoff, Donald J.
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Volume:
2599
Year:
1996
Language:
english
DOI:
10.1117/12.230371
File:
PDF, 1.03 MB
english, 1996
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