SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Scattering and Surface Roughness - Scatter-probe near-field optical microscopy of metallic surfaces
Mendez, Eugenio R., Negrete-Regagnon, Pedro, Zavala Ortiz, Saul A., Gonzalez-Rodriguez, Criseida, Gu, Zu-Han, Maradudin, Alexei A.Volume:
3141
Year:
1997
Language:
english
DOI:
10.1117/12.287790
File:
PDF, 322 KB
english, 1997