SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] X-Ray Optics, Instruments, and Missions - X-ray CCD calibration for the AXAF CCD Imaging Spectrometer
Bautz, Mark W., Pivovaroff, Michael J., Baganoff, F., Isobe, Takashi, Jones, Stephen E., Kissel, Steven E., LaMarr, Beverly, Manning, Herbert L., Prigozhin, Gregory Y., Ricker, Jr., George R., Nousek,Volume:
3444
Year:
1998
Language:
english
DOI:
10.1117/12.331238
File:
PDF, 3.28 MB
english, 1998