SPIE Proceedings [SPIE Symposium on Integrated Optoelectronics - San Jose, CA (Thursday 20 January 2000)] Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V - 267-W cw AlGaAs/GaInAs diode laser bars
Braunstein, Juergen, Mikulla, Michael, Kiefer, Rudolf, Walther, Martin, Jandeleit, Juergen, Brandenburg, Wolfgang, Loosen, Peter, Poprawe, Reinhart, Weimann, Guenter, Burnham, Geoffrey T., He, XiaoguaVolume:
3945
Year:
2000
Language:
english
DOI:
10.1117/12.380551
File:
PDF, 1.01 MB
english, 2000