SPIE Proceedings [SPIE Photonics Asia 2002 - Shanghai,...

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SPIE Proceedings [SPIE Photonics Asia 2002 - Shanghai, China (Monday 14 October 2002)] Advanced Materials and Devices for Sensing and Imaging - Using temporal phase-unwrapping mask for shape measurement

Lin, Yuchi, Cheng, Dongmei, Niu, Xiaobing, Zhao, Meirong, Sun, Zhanyuan, Zhang, Yuxiang, Yao, Jianquan, Ishii, Yukihiro
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Volume:
4919
Year:
2002
Language:
english
DOI:
10.1117/12.465822
File:
PDF, 347 KB
english, 2002
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