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SPIE Proceedings [SPIE BiOS - San Francisco, California (Saturday 23 January 2010)] Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XVII - Quadriwave lateral shearing interferometry for quantitative phase microscopy: applications to long-duration imaging
Bon, Pierre, Conchello, Jose-Angel, Cogswell, Carol J., Wattellier, Benoit, Monneret, Serge, Wilson, Tony, Brown, Thomas G., Marguet, DidierVolume:
7570
Year:
2010
Language:
english
DOI:
10.1117/12.844930
File:
PDF, 8.69 MB
english, 2010