SPIE Proceedings [SPIE International Conference on Image Processing and Pattern Recognition in Industrial Engineering - Xi'an, China (Saturday 7 August 2010)] International Conference on Image Processing and Pattern Recognition in Industrial Engineering - Situation estimation modeling and simulation of aerial optical-electronic sensors
Shi, Zhi-fu, Du, Zhengyu, Liu, Bin, Liu, Hai-yan, Zhou, Dai-zhongVolume:
7820
Year:
2010
Language:
english
DOI:
10.1117/12.866752
File:
PDF, 289 KB
english, 2010