SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 15 April 2013)] Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III - Study of EUV and x-ray radiation hardness of silicon photodiodes
Zabrodsky, Vladimir V., Aruev, Pavel, Filimonov, Vladimir V., Sobolev, Nikolay A., Sherstnev, Evgeniy V., Belik, Viktor P., Nikolenko, Anton D., Ivlyushkin, Denis V., Pindyurin, Valery F., Shadrin, NiVolume:
8777
Year:
2013
Language:
english
DOI:
10.1117/12.2017478
File:
PDF, 707 KB
english, 2013