SPIE Proceedings [SPIE The Hague '90, 12-16 April - The Hague, Netherlands (Thursday 1 March 1990)] Industrial Inspection II - CAD/CAM-coupled image processing systems
Ahlers, Rolf-Juergen, Rauh, W., Braggins, Donald W.Volume:
1265
Year:
1990
Language:
english
DOI:
10.1117/12.20227
File:
PDF, 242 KB
english, 1990