SPIE Proceedings [SPIE Electronic Imaging: Science & Technology - San Jose, CA (Sunday 28 January 1996)] Machine Vision Applications in Industrial Inspection IV - Surface analysis of cast aluminum by means of artificial vision and AI-based techniques
Platero, Carlos, Fernandez, Carlos, Campoy, Pascual, Aracil, Rafael, Rao, A. Ravishankar, Chang, NingVolume:
2665
Year:
1996
Language:
english
DOI:
10.1117/12.232250
File:
PDF, 1006 KB
english, 1996