SPIE Proceedings [SPIE Optical Metrology - Munich, Germany...

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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Metrology for Arts and Multimedia - Using optically scanned 3D data in the restoration of Michelangelo's David

Scopigno, Roberto, Cignoni, Paolo, Callieri, Marco, Ganovelli, Fabio, Impoco, G., Pingi, P., Ponchio, F., Salimbeni, Renzo
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Volume:
5146
Year:
2003
Language:
english
DOI:
10.1117/12.499921
File:
PDF, 1.19 MB
english, 2003
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