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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Optical measurement of electric fields
Steiger, Andreas, Osten, Wolfgang, Kujawinska, Malgorzata, de la Rosa, M. I., Perez, Conception, Creath, Katherine, Gemisic, Minja, Gruetzmacher, Klaus, Seidel, JoachimVolume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.500082
File:
PDF, 630 KB
english, 2003