SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Interferometry XII: Techniques and Analysis - Synthetic spatial coherence function for optical tomography and profilometry: influence of the observation condition
Duan, Zhihui, Creath, Katherine, Schmit, Joanna, Kozaki, Hirokazu, Miyamoto, Yoko, Rosen, Joseph, Takeda, MitsuoVolume:
5531
Year:
2004
Language:
english
DOI:
10.1117/12.559139
File:
PDF, 598 KB
english, 2004