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SPIE Proceedings [SPIE Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation - Beijing, China (Friday 13 October 2006)] Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation - A boundary scan cell insertion method for mixed signal board
Chen, Xiaomei, Fang, Jiancheng, Wang, Zhongyu, Meng, Xiaofeng, Zhong, Bo, Ji, HongVolume:
6358
Year:
2006
Language:
english
DOI:
10.1117/12.718769
File:
PDF, 280 KB
english, 2006