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SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 7 April 2008)] Semiconductor Lasers and Laser Dynamics III - Spectral measurements and simulations of 405 nm (Al, In)GaN test laser structures grown on SiC and GaN substrate
Meyer, Tobias, Panajotov, Krassimir P., Sciamanna, Marc, Braun, Harald, Schwarz, Ulrich T., Valle, Angel A., Michalzik, Rainer, Queren, Désirée, Schillgalies, Marc O., Brüninghoff, Stefanie, Laubsch,Volume:
6997
Year:
2008
Language:
english
DOI:
10.1117/12.781277
File:
PDF, 1.44 MB
english, 2008