SPIE Proceedings [SPIE Seventh International Conference on Thin Film Physics and Applications - Shanghai, China (Friday 24 September 2010)] Seventh International Conference on Thin Film Physics and Applications - Analysis of the measured method for scattering properties of high-reflection coating
Liu, Huasong, Chu, Junhao, Wang, Zhanshan, Luo, Zheng, Wang, Zhanshan, Ji, Yiqin, Fan, Yongkai, Fan, RongweiVolume:
7995
Year:
2010
Language:
english
DOI:
10.1117/12.888309
File:
PDF, 303 KB
english, 2010