SPIE Proceedings [SPIE SPIE Optical Systems Design - Marseille, France (Monday 5 September 2011)] Optical Fabrication, Testing, and Metrology IV - Stress polishing of E-ELT segment at LAM: full-scale demonstrator status
Laslandes, Marie, Duparré, Angela, Geyl, Roland, Rousselet, Nicolas, Ferrari, Marc, Hugot, Emmanuel, Floriot, Johan, Vivès, Sébastien, Lemaitre, Gérard, Carré, Jean François, Cayrel, MarcVolume:
8169
Year:
2011
Language:
english
DOI:
10.1117/12.896704
File:
PDF, 3.74 MB
english, 2011