Investigating the Structural, Thermal, and Electronic...

Journal of Electronic Materials 2016 / 11 Vol. 45; Iss. 11

Investigating the Structural, Thermal, and Electronic Properties of the Zircon-Type ZrSiO4, ZrGeO4and HfSiO4Compounds

Chiker, Fafa, Boukabrine, Fatiha, Khachai, H., Khenata, R., Mathieu, C., Bin Omran, S., Syrotyuk, S. V., Ahmed, W. K., Murtaza, G.
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Volume:
45
Language:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-016-4767-z
Date:
November, 2016
File:
PDF, 2.25 MB
english, 2016
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